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An Evaluation Method for Anti-sEU Effects Design of SRAM-Based FPGA on Navigation Satellites

机译:基于SRAM的FPGA对导航卫星的抗SEU效应设计评价方法

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In the space application of electronic equipment on navigation satellites, static random access memory (SRAM)-based field programmable gate array (FPGA) circuits will encounter single event effects (SEEs) in space radiation environment, which may lead to functional abnormalities. The mainstream measures often apply hardening technologies such as triple modular redundancy and refreshing error correction to the anti-SEU effects protection designs of FPGA circuits on navigation satellite. Since not all single event upsets (SEUs) will lead to system function failure, in order to comprehensively evaluate the validity of the protection design methods, based on FPGA resource characteristics, this paper firstly proposes an index called classified configuration data abnormal rate. On this basis, according to the effects of single event upsets in different configuration areas on the circuit function, the failure rate and curves of reliability change of different configuration structures are obtained. And through bit-by-bit upset fault injection tests based on the internal configuration access port (ICAP) circuits to verify these evaluation indicators, the experimental results prove the validity of the evaluation method.
机译:在导航卫星上的电子设备的空间应用中,静态随机存取存储器(SRAM)基场可编程门阵列(FPGA)电路将在太空辐射环境中遇到单个事件效果(看到),这可能导致功能异常。主流措施往往应用硬化技术,如三重模块化冗余和刷新误差校正,以对导航卫星FPGA电路的反赛区效果保护设计。由于并非所有单一事件UPSET(SEU)会导致系统功能故障,以便全面评估保护设计方法的有效性,根据FPGA资源特征,本文首先提出了称为分类配置数据异常率的索引。在此基础上,根据不同配置区域对电路功能的单一事件扰动的影响,获得了不同配置结构的可靠性变化的故障率和曲线。并且通过基于内部配置访问端口(ICAP)电路的逐位镦粗故障注入测试来验证这些评估指标,实验结果证明了评价方法的有效性。

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