Abstract: It is known that the measurement range of holographic interferometry methods is limited due to the loss of correlation between interference waves and high frequency of interference fringes. Therefore to study continuous processes with big shift and phase changes it is necessary to develop a special method of holographic interferometry. The use of the suggested method enables to measure the object through the series of double exposure holographic interferograms rather than to measure it through one interferogram as in the rest of known methods.!1
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