首页> 外文会议>Electrical Performance of Electronic Packaging, 1997., IEEE 6th Topical Meeting on >A new technique for the extraction of SPICE-type equivalent circuits from measured or computed S-parameters of microstrip components and discontinuities
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A new technique for the extraction of SPICE-type equivalent circuits from measured or computed S-parameters of microstrip components and discontinuities

机译:一种新技术,可从测量或计算出的微带元件和不连续性的S参数中提取SPICE型等效电路

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This paper introduces a new technique based on the application of the Genetic Algorithm (GA) for extracting the equivalent circuits for measured or computed S-parameters that can be inserted into SPICE simulations. The GA is a robust optimization tool that is shown to yield excellent result for the sample test case of a right angle bend in a microstrip line.
机译:本文介绍了一种基于遗传算法(GA)的应用,用于提取可以插入Spice模拟的测量或计算的S参数的等效电路。 GA是稳健的优化工具,其示出为在微带线中的直角弯曲的样本测试情况产生优异的结果。

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