Improved technique for measuring complex reflection coefficients of microwave devices using only two power detectors

机译：仅使用两个功率检测器测量微波装置的复数反射系数的改进技术

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The paper describes an improved technique for measuring the complex reflection coefficients of microwave devices using the four-port multi-state reflectometer (which requires two power detectors and other commonly-available laboratory components). Simulation and experimental tests have confirmed that the prototype instrument (implemented in waveguide form) is able to yield measurement accuracies of within /spl plusmn/0.01 for magnitude and /spl plusmn/1/spl deg/ for phase.

机译：本文介绍了一种改进的技术，该技术使用四端口多状态反射仪（需要两个功率检测器和其他常用的实验室组件）来测量微波设备的复数反射系数。仿真和实验测试已经证实，原型仪器（以波导形式实现）能够产生幅度在/ spl plusmn / 0.01之内和相位在/ spl plusmn / 1 / spl deg /之内的测量精度。

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《Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE》|1998年|P.634-637|共4页
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Yeo; S.P.; Tay; S.T.;
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中图分类无线电电子学、电信技术;
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专利

1. Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices [J] . Yeo S.P., Cheng M. Electronics Letters . 1996,第6期

机译：改进的四端口仪器，使用两个功率检测器来测量微波设备的复杂反射系数
2. Improved design for multistate reflectometer (with two power detectors) for measuring reflection coefficients of microwave devices [J] . Yeo S.P., Tay S.T. IEEE Transactions on Instrumentation and Measurement . 2000,第1期

机译：用于测量微波设备反射系数的多状态反射仪（带有两个功率检测器）的改进设计
3. Testing microwave devices under different source impedance values-a novel technique for on-line measurement of source and device reflection coefficients [J] . Madonna G., Ferrero A. IEEE Transactions on Instrumentation and Measurement . 2000,第2期

机译：在不同源阻抗值下测试微波设备-一种在线测量源和设备反射系数的新技术
4. Improved technique for measuring complex reflection coefficients of microwave devices using only two power detectors [C] . Yeo S.P., Tay S.T., Institute of Electric and Electronic Engineer IEEE Instrumentation and Measurement Technology Conference . 1998

机译：使用两个功率检测器测量微波器件复杂反射系数的改进技术
5. Determination of the Gyro-electric Reflection and Transmission Coefficients in the Fused Quartz iTOP Cherenkov Particle ID Detectors at the Belle II Experiment [D] . Jeandron, Michael. 2020

机译：熔融石英ITOP Cherenkov粒子ID探测器中陀螺电反射和透射系数的测定在Belle II实验中的探测器
6. Barothermal Theory of Two Devices for Measuring Absorption Coefficients [O] . H. S. Bennett 1975

机译：两种测量吸收系数的装置的重热理论
7. Testing microwave devices under different source impedances: a novel technique for on-line measurement of source and device reflection coefficients [O] . Ferrero Andrea Pierenrico, Madonna G., Pirola Marco, 2000

机译：在不同源阻抗下测试微波设备：一种在线测量源和设备反射系数的新技术
8. Technique for Measuring the Effective Source Reflection Coefficient of Two-Resistor Power Splitters [R] . Moyer, R. D. 1985

机译：双电阻功率分配器有效源反射系数测量技术

Improved technique for measuring complex reflection coefficients of microwave devices using only two power detectors

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