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Reduction of excess laser noise in electro-optic sampling of high-speed circuits for eye-diagram measurements

机译:高速电路电光采样中的过度激光噪声减少了眼图测量

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摘要

A new optical detection scheme for measurements of small optical phase shifts is proposed and demonstrated. The scheme allows broadband reduction of excess laser noise. ~20 dB noise reduction is achieved in electro-optic sampling system for testing high-speed integrated circuits.
机译:提出并证明了用于测量小光学相移的新光学检测方案。该方案允许宽带减少过量激光噪声。电光采样系统实现了〜20dB降噪,用于测试高速集成电路。

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