As delay models used in logic timing simulation become more and more complex, the problem of model parameter values extraction arise as an important issue, which it is necessary to face in order to achieve a practical implementation of the model. In this way, this paper describes the characterization process associated with the previously developed delay degradation model for CMOS logic gates (DDM) and the implementation of an automatic characterization tool that automates the process and allows easy and fast model parameter extraction.
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