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The study and analysis of the conducted EMI suppression on power MOSFET using passive snubber circuits

机译:使用无源缓冲电路的功率MOSFET传导EMI抑制的研究与分析

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This paper presents the study and analysis of RCD, RLD, and RCD-RLD passive snubber circuits affect on the power losses and suppression of the conducted EMI emission on the power MOSFET. The paper describes the snubber effects on dv/dt during the turn-off period, di/dt during the turn-on period, overvoltage, spike voltage, power loss and the conducted EMI emission. A 100 watt-50 kHz buck converter is used in the simulation and experiment. The measured and simulated results of conducted EMI emission are compared to verify the effectiveness of each snubber circuit.
机译:本文介绍了RCD,RLD和RCD-RLD无源缓冲电路对功率损耗的影响以及对功率MOSFET传导EMI辐射抑制的研究和分析。本文介绍了在关断期间对dv / dt的缓冲效应,在开通期间对di / dt的缓冲效应,过压,尖峰电压,功率损耗和传导EMI的辐射。在仿真和实验中使用了一个100瓦特50 kHz的降压转换器。比较了传导EMI辐射的测量结果和仿真结果,以验证每个缓冲电路的有效性。

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