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Scanning Electron Microscope (SEM) of leaf cell morphology and inheritance for Corn Leaf Aphid (CLA) resistance in Maize

机译:玉米叶片细胞形态的扫描电子显微镜(SEM)和抗玉米玉米蚜(CLA)遗传

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Corn Leaf Aphid (CLA) was first named A phis maidis by Fitch (1856) and later given the scientific name Rhop alosiphum maidis Fitch.It is one of the most abundant species among the twelve species found on maize in the United States (Stoetzel and Miller,2001). CLA is considered to have originated in Asia.It occurs throughout the world and is an economically important cereal aphid species in tropical climates (Blackman and Eastop,1984).In North America, it migrates annually from south to north ( Kieckhefer et al.,1974).CLA infestations can be influenced by environmental factors such as the plant densities and N2 level of the host.Ali and Ahmed (1996) found that CLA infestation increased with higher plant densities and host N2 content in wheat.Temperature is probably the most important environmental variable influencing rates of aphid development and reproduction.Corn leaf aphids can cause occasional yield loss of maize.We have observed genetic resistance to the aphid species.An improved artificial inoculation technique with hairpin clip cages was devised.The purposes of this study were to develop manual infestation techniques and quantification methods for screening aphid resistance in tropical maize and to study the leaf cell morphology and to apply the techniques in field trials.
机译:玉米叶蚜(CLA)最初由Fitch(1856年)命名为A phis maidis,后来以科学名称Rhop alosiphum maidis Fitch命名,是美国在玉米中发现的十二个物种中最丰富的物种之一(Stoetzel和Miller,2001)。 CLA被认为起源于亚洲,它遍布世界各地,是热带气候中一种经济上重要的谷物蚜虫物种(Blackman和Eastop,1984)。在北美,它每年从南到北迁移(Kieckhefer等, 1974年).CLA侵染可能受到环境因素的影响,例如植物密度和寄主的N2水平.Ali和Ahmed(1996)发现,随着小麦中植物密度和寄主N2含量的增加,CLA侵染增加。重要的环境变量是影响蚜虫发育和繁殖的重要因素。玉米叶蚜虫有时会导致玉米产量损失。我们观察到了对蚜虫物种的遗传抗性。设计了一种改良的带发夹式人工笼的人工接种技术。开发用于筛查热带玉米中蚜虫抗性的人工侵染技术和定量方法,并研究叶细胞的形态和将这些技术应用于现场试验。

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