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首页> 外文会议>Fifth international symposium on instrumentation science and technology >A Multi-function Tribological Probe Microscope with a hot tip for thermal measurement
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A Multi-function Tribological Probe Microscope with a hot tip for thermal measurement

机译：带有热尖端的多功能摩擦探针显微镜，用于热测量

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Surface mechanical and thermal properties objectively affect our touch-feel perception. However, it is still far from known that how the surface properties affect the stimulus to our nerve system and make us feel warm or cold, hard or soft, rough or smooth, etc. Physically, although the surface properties can be measured individually by different instruments, it is desirable to have a multifunctional instrument to facilitate the investigation of the relationship between the surface physical characteristics and the corresponding perceived touch feeling by human. In our previous work, a novel multi-functional tribological probe microscope (TPM) was developed to provide mappings of four functions of a surface at micro and nanometer scales. The four functions of surface topography, hardness, Young's modulus and friction are measured in a single scan set-up and they are potentially linked in space and time to provide cross-correlation in between. In this paper, to achieve the additional function of micro thermal analysis, we proposed a new scheme of thermal probe with a hot wire (Wollaston wire) buried beneath a Berkovich diamond indenter. The details of mechanical design and associated electronic circuits are presented. Meanwhile, the paper also explains the principle of the hot-tip technique by relating its signals to established physical parameters of materials, a method that separates sample information from the artifact caused by the indentation geometry of the diamond tip. Experimental results of thermal conductivity measurements on certain metal specimens are discussed.
机译：表面机械性能和热性能会客观地影响我们的触感。然而，仍然未知的是，表面性质如何影响对神经系统的刺激，使我们感到温暖或寒冷，硬或软，粗糙或光滑等。从物理上讲，尽管可以通过不同方法分别测量表面性质仪器，期望有一种多功能仪器，以促进对表面物理特性与人类相应的感知触感之间关系的研究。在我们以前的工作中，开发了一种新型的多功能摩擦学探针显微镜（TPM），以提供微米和纳米尺度下表面的四个功能的映射。表面形貌，硬度，杨氏模量和摩擦力这四个功能是在单次扫描设置中测量的，它们可能在空间和时间上相互关联，以提供两者之间的互相关性。在本文中，为了实现微热分析的附加功能，我们提出了一种新的热探针方案，将热线（Wollaston线）埋在Berkovich金刚石压头下。给出了机械设计和相关电子电路的详细信息。同时，本文还通过将其信号与已建立的材料物理参数相关联来说明热尖技术的原理，该方法将样品信息与由金刚石尖头的压痕几何形状引起的伪影分离开来。讨论了在某些金属样品上进行热导率测量的实验结果。

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