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Thin-Film Active Nano-PWAS for Structural Health Monitoring

机译：用于结构健康监测的薄膜有源纳米PWAS

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Structural health monitoring (SHM) is an emerging field in which smart materials interrogate structural components to predict failure, expedite needed repairs, and thus increase the useful life of those components. Piezoelectric wafer active sensors (PWAS) have been previously adhesively-bonded to structures and demonstrate the ability to detect and locate cracking, corrosion, and disbonding through use of pitch-catch, pulse-echo, electro/mechanical impedance, and phased array technology. The present research considers structurally-integrated PWAS that can be fabricated directly to the structural substrate using thin-film nano technologies (e.g., pulsed-laser deposition, sputtering, chemical vapor deposition, etc.) Because these novel PWAS are made up of nano layers they are dubbed nano-PWAS. Nano-PWAS research consists of two parts, thin-film fabrication and nano-PWAS construction. The first part is how to fabricate the piezoelectric thin-film on structure materials. In our research, ferroelectric BaTiO3 (BTO) thin films were successfully deposited on structure material Ni and Ti by pulsed laser deposition under the optimal synthesis conditions. Microstructural studies revealed that the as-grown BTO thin films have the nanopillar structures and the good interface structures with no inter-diffusion or reaction. The dielectric and ferroelectric property measurements exhibit that the BTO films have a relatively large dielectric constant, a small dielectric loss, and an extremely large piezoelectric response with a symmetric hysteresis loop. The second part is nano-PWAS construction and how they are related to the active SHM interrogation methods. Nano-PWAS architecture achieved through thin-film deposition technology and its potential application for SHM were discussed here. The research objective is to develop the fabrication and optimum design of thin-film nano-PWAS for structural health monitoring applications.
机译：结构健康监测（SHM）是一个新兴领域，在该领域中，智能材料会询问结构组件以预测故障，加快所需的维修并因此增加这些组件的使用寿命。压电晶片有源传感器（PWAS）以前已通过粘合剂粘结到结构上，并通过使用间距捕获，脉冲回波，电/机械阻抗和相控阵技术展示了检测和定位裂纹，腐蚀和剥离的能力。本研究考虑了可以使用薄膜纳米技术（例如脉冲激光沉积，溅射，化学气相沉积等）直接制造到结构基板的结构集成式PWAS，因为这些新颖的PWAS由纳米层组成它们被称为纳米PWAS。纳米PWAS研究包括两个部分，薄膜制造和纳米PWAS构建。第一部分是如何在结构材料上制造压电薄膜。在我们的研究中，在最佳合成条件下，通过脉冲激光沉积在结构材料Ni和Ti上成功沉积了铁电BaTiO3（BTO）薄膜。微观结构研究表明，生长中的BTO薄膜具有纳米柱结构和良好的界面结构，没有相互扩散或反应。介电和铁电性能测量表明，BTO膜具有相对较大的介电常数，较小的介电损耗和具有对称磁滞回线的极大压电响应。第二部分是纳米PWAS的结构及其与主动SHM询问方法的关系。本文讨论了通过薄膜沉积技术实现的纳米PWAS体系结构及其在SHM中的潜在应用。研究目的是开发用于结构健康监测应用的薄膜纳米PWAS的制造和最佳设计。

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