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Microstructure-Sensitive Probabilistic Fatigue Modeling of Notched Components

机译：缺口构件的微结构敏感性概率疲劳建模

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摘要

Microstructure-sensitive, simulation-based strategies for modeling fatigue life reduction in cyclically loaded notched components offer a means to augment costly experiments and facilitate consideration of microstructures not yet processed. Using computational polycrystal plasticity and probabilistic arguments, a strategy is presented that links notch root mi-crostructure heterogeneity to scatter in fatigue response and notch size effects. The notch root stress gradient field and grain size distribution effects are considered for a polycrystalline PM processed Ni-base superalloy IN100. The probability of forming and propagating a crack from the grain scale to a transition crack length (LEFM applicable) is approximated using shear-based fatigue indicator parameters (FIPs) computed within the uncracked notched specimen. This model for crack formation and early growth is calibrated to existing smooth specimen experiments. Cumulative distribution functions and probabilistic strain life functions are constructed for various notch root radii and remote strain amplitudes.
机译：微观结构敏感的，基于模拟的策略，用于对循环加载的缺口构件的疲劳寿命降低进行建模，提供了一种手段来增加昂贵的实验并促进对尚未处理的微观结构的考虑。利用计算的多晶可塑性和概率论证，提出了一种将缺口根微观结构异质性与疲劳响应和缺口尺寸效应的分散联系起来的策略。对于多晶PM处理的镍基高温合金IN100，考虑了缺口根应力梯度场和晶粒尺寸分布效应。使用在未开裂的缺口试样中计算出的基于剪切的疲劳指标参数（FIP），可以估算出从裂纹到裂纹扩展至过渡裂纹长度（适用LEFM）的裂纹形成和传播的可能性。裂纹形成和早期生长的模型已根据现有的光滑试样实验进行了校准。针对各种缺口根半径和远程应变幅度构造了累积分布函数和概率应变寿命函数。

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