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Characterization and modeling of self-heating effect on transient current overshoot in poly-Si TFTs fabricated on glass substrate

机译:在玻璃基板上制造的多晶硅TFT中自热效应对瞬态电流过冲的影响和建模

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Characteristics of transient drain current overshoot in poly-Si TFTs are measured, and an equivalent thermal circuit model is proposed based on the experimental results. By changing the terminals on which a step voltage is applied, two main mechanisms causing the transient current, i.e., the electron trapping effect and the self-heating effect, can be separately evaluated. Using this new technique, we discuss the heat conduction mechanisms in TFTs responsible for describing the transient current overshoot component induced by the self-heating effect.
机译:测量了多晶硅TFT中的瞬态漏极电流过冲的特性,并基于实验结果提出了等效的热电路模型。通过改变施加阶跃电压的端子,可以分别评估引起瞬态电流的两个主要机理,即电子俘获效应和自热效应。使用这项新技术,我们讨论了TFT中的热传导机制,这些热传导机制负责描述由自热效应引起的瞬态电流过冲分量。

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