首页> 外文会议>ICMLC;International Conference on Machine Learning and Cybernetics >Comparison of electrical imaging algorithms by optics tool
【24h】

Comparison of electrical imaging algorithms by optics tool

机译:用光学工具比较电成像算法

获取原文

摘要

Electrical impedance tomography (ET) is a technique for reconstructing conductivity of an inhomogeneous medium by injecting current at the boundary of an object and measuring the resulting voltage changes. ET techniques have been widely adopted for visualizing distributions of materials in industrial processes. In comparison to other tomography modalities, ET's advantages include low cost, rapid response, no radiation and being non-intrusive. In this paper, a group of most widely adopted electrical imaging algorithms are compared based on imaging time, correlation coefficient, the relative error, the objective function value, iterative times and convergence speed in a visualization tool OPTICS. Experiment results show the applicable ranges, limitations and complementary natures of different imaging algorithms.
机译:电阻抗断层扫描(ET)是一种通过在对象的边界处注入电流并测量所产生的电压变化来重构非均质介质的电导率的技术。 ET技术已被广泛用于可视化工业过程中的材料分布。与其他层析成像方式相比,ET的优势包括成本低,响应速度快,无辐射且无干扰。在可视化工具OPTICS中,根据成像时间,相关系数,相对误差,目标函数值,迭代时间和收敛速度,比较了一组最广泛采用的电子成像算法。实验结果表明了不同成像算法的适用范围,局限性和互补性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号