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首页> 外文会议>International Conference on VLSI Design;International Conference on Embedded Systems Design >VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests
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VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests

机译：VAST：使用签名测试的硅后虚化和RF /混合信号电路诊断

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摘要

Post-silicon validation of RF/mixed-signal circuits is challenging due to the need to excite all possible operational modes of the DUT in order to establish equivalence between its specified and observed behaviors and to ensure that the DUT does not produce any unexpected behaviors that can lead to system failure. In this research, we first develop a methodology for determining if the DUT contains behaviors that are not explicitly included in its behavioral model. A complex (optimized) test waveform is applied to the DUT and its test response signature is captured. It is seen that in the presence of unexpected DUT behaviors, the residual error in the test response signature from that defined by the model, cannot be minimized below a certain threshold by manipulating the model parameters in any way. If however, it is determined that the model is adequate but the signature is different from the expected, then a procedure is developed for determining which sub module is responsible for the difference (i.e. causes the system level specifications to be different from that specified by the behavioral model). Experiments on an RF transceiver are performed to demonstrate the effectiveness of the proposed validation and diagnosis approach.
机译：由于需要激发DUT的所有可能的工作模式以便在其指定行为与观察到的行为之间建立等效关系并确保DUT不会产生任何意想不到的行为，因此对RF /混合信号电路进行硅后验证非常具有挑战性会导致系统故障。在这项研究中，我们首先开发一种方法来确定DUT是否包含未明确包含在其行为模型中的行为。将复杂（优化）的测试波形应用于DUT，并捕获其测试响应签名。可以看出，在存在意外DUT行为的情况下，无法通过任何方式操纵模型参数将模型定义的测试响应签名中的残留误差最小化到某个阈值以下。但是，如果确定模型足够，但签名与预期不符，则开发一种程序来确定哪个子模块负责差异（即，导致系统级别规范与标准要求的规范不同）。行为模型）。在RF收发器上进行的实验证明了所提出的验证和诊断方法的有效性。

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