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首页> 外文会议>IEEE International Symposium on Circuits and Systems >Robust random chip ID generation with wide-aperture clocked comparators and maximum likelihood detection
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Robust random chip ID generation with wide-aperture clocked comparators and maximum likelihood detection

机译：具有宽口径时钟比较器和最大似然检测的强大随机芯片ID生成

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摘要

In many applications, mass-produced chips need to be tagged with individual identification numbers (i.e. chip ID). One way to do this without requiring post-fabrication programming steps is to generate the unique ID per chip exploiting random device mismatch. However, it can be prone to mis-identification due to time-varying noise that may cause a different ID to be read from the same chip each time. This paper presents a wide-aperture, low-noise clocked comparator design and a novel ID detection scheme based on maximum likelihoods (ML) that can significantly reduce the probability of mis-identification for such random chip ID generators. A prototype chip fabricated in 0.18-μm CMOS demonstrates the measured input-referred noise of the comparator as low as 265-μVrms, while preserving the wide input-referred offset distribution of 22-mVrms. As for the detection scheme, the analysis shows that when detecting 1024 unique IDs, the proposed ML detection scheme can achieve the mis-identification rate of 1.73×10−18 with 64-bits while the previous scheme based on Hamming distances (HD) would require 90-bits.
机译：在许多应用中，批量生产的芯片需要用单独的标识号（即芯片ID）标记。一种无需后制造编程步骤的方法是利用随机设备失配为每个芯片生成唯一ID。但是，由于随时间变化的噪声可能会导致误识别，这可能会导致每次从同一芯片读取不同的ID。本文提出了一种宽孔径，低噪声时钟比较器设计，以及一种基于最大似然（ML）的新颖ID检测方案，该方案可以显着降低此类随机芯片ID发生器的误识别概率。用0.18-μmCMOS制成的原型芯片演示了比较器的测得的输入参考噪声低至265-V rms ，同时保留了22-mV 的宽输入参考偏移分布。 rms 。对于检测方案，分析表明，当检测到1024个唯一ID时，提出的ML检测方案在64位的情况下可以达到1.73×10 −18 的误识别率，而以前的方案是基于在汉明距离（HD）上将需要90位。

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