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A Digital to Time Converter with Fully Digital Calibration Scheme for Ultra-Low Power ADPLL in 40 nm CMOS

机译:一种带有全数字校准方案的数字转换器,用于40 nm CMOS中的超低功耗ADPLL

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In this paper, a digital-to-time converter (DTC) assisting a time-to-digital converter (TDC) as a fractional phase error detector in an ultra-low power ADPLL is proposed and demonstrated in 40nm CMOS. A phase prediction algorithm via the assistance of the DTC reduces the required TDC range, thus saving substantial power. Additionally, a fully digital calibration algorithm is presented and proved to validate the whole ADPLL system and improve the DTC linearity. At 1 V supply voltage, the measured time resolution of the DTC is 22 ps. The TDC resolution is also indirectly measured with a closed-loop 2.4 GHz ADPLL, where -95.3 dBc/Hz in-band phase noise corresponds to a worst-case TDC resolution of 22 ps.
机译:本文提出了一种数字转换器(DTC),其辅助时间转换器(TDC)作为超低功率ADPLL中的分数相位误差检测器,并在40nm CMOS中演示。通过DTC的帮助的相位预测算法减少了所需的TDC范围,从而节省了大量功率。此外,介绍了完全数字校准算法,并证明验证整个ADPLL系统并提高DTC线性度。在1 V电源电压下,DTC的测量时间分辨率为22 ps。 TDC分辨率也用闭环2.4GHz ADPLL间接测量,其中-95.3 DBC / Hz带内噪声对应于22 PS的最坏情况TDC分辨率。

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