首页> 外文会议>IEEE AUTOTESTCON >Wire arc defect localization and mathematical characterization by MCTDR reflectometry
【24h】

Wire arc defect localization and mathematical characterization by MCTDR reflectometry

机译:MCTRDR反射测量仪的电弧缺陷定位和数学特征

获取原文

摘要

This paper demonstrates the feasibility of detecting brief intermittent arcs on wired networks and characterizing them by mathematical modelization. We develop models of reflections generated by arc defects in transmission lines excited by specific test signals, using time-domain reflectometry. Arc fault causes a local modification of the propagation characteristics of the cable. The MCTDR (Multi-carrier Time Domain reflectometry) reflectogram shows the arc as peaks due to impedance change. The location and arc characteristics are automatically calculated and displayed by a computer device. This study provides an accurate assessment of the severity of the arc fault, as the peak amplitude depends heavily on the arc fault impedance, but also on other impedance changes on the cable.
机译:本文展示了检测有线网络上的短暂间歇弧的可行性,并通过数学建模表征它们。我们使用时域反射测量法开发通过特定测试信号激发的传输线中的电弧缺陷产生的反射模型。电弧故障导致电缆传播特性的本地修改。 MCTRD(多载波时域反射区)反射图显示了由于阻抗变化引起的峰值。计算机设备自动计算和显示位置和电弧特性。本研究提供了对电弧故障的严重性的准确评估,因为峰值幅度在很大程度上取决于电弧故障阻抗,还取决于电缆上的其他阻抗变化。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号