• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文会议>IEEE AUTOTESTCON >Output compaction for high X-densities via improved input rotation compactor design
【24h】

Output compaction for high X-densities via improved input rotation compactor design

机译：通过改进的输入旋转压缩机设计输出高X密度的压实

获取原文
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

Testing requires checking whether the output response of a circuit or system is correct or has an error. Combinational linear compactors can be used to compact the output response for a large number of scan chains into a smaller number of outputs. While some compactor designs can guarantee observation of all scan chains in the presence of a small number of X's (unknowns), this may not be sufficient for designs with higher X densities. This paper presents a completely new methodology for designing an output compactor based on using an input rotator that is able to maintain high observability even in the presence of high X-densities while still achieving high compaction ratios. The key idea is to place a combinational rotator in front of a carefully designed XOR network that maximizes separation of the input dependence in adjacent inputs within a particular shift distance of the input rotator. A systematic procedure is presented for constructing such a compactor given a targeted compaction ratio and maximum shift distance. Experimental results show significant improvement in observability for high X-densities in comparison to existing state-of-the-art compaction methods including X-compact and Steiner compactors for the same compaction ratio. This results in higher fault coverage, better diagnosis, and less overhead when output compaction is employed in designs with high X-densities.
机译：测试需要检查电路或系统的输出响应是否正确或具有错误。组合线性压实机可用于将大量扫描链的输出响应压缩成较少数量的输出。虽然一些压实机设计可以保证在存在少量X（未知数）的情况下观察所有扫描链，但这可能不足以具有更高X密度的设计。本文提出了一种基于使用输入旋转器设计输出压实机的全新方法，即使在高X长度存在的情况下，能够保持高观察性，同时仍然实现高压缩比率。关键思想是将组合旋转器放置在精心设计的XOR网络前面，最大化输入旋转器的特定偏移距离内的相邻输入中的输入依赖性的分离。提供了一种用于构建鉴于目标压实率和最大偏移距离的这种压实机的系统程序。实验结果与现有的最先进的压实方法相比，具有相同的压实率的X-Compact和Steiner压实机的现有最先进的压实方法，显着改善了高X密度。这导致在具有高X密度的设计中使用输出压实时更高的故障覆盖率，更好的诊断和更少的开销。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号