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首页> 外文会议>Conference on micro-structured and specialty optical fibres IV >Measurement of refractive index profile of non-symmetric, complex silica preforms with high refractive index differences
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Measurement of refractive index profile of non-symmetric, complex silica preforms with high refractive index differences

机译：测量具有高折射率差异的非对称，复杂的二氧化硅预成型坯的折射率分布

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Refractive index profile measurement is a key instrument for characterization of optical properties of preforms, which are used for drawing of high-quality optical fibers. Common industrial optical preform analyzers have been designed for measurement of simple symmetric structures such as step-index or graded-index preforms with refractive index close to the silica (n= 1.457 at 633 nm). However, these conditions are usually far from more complex structures used in fiber lasers or in fiber sensor area. Preforms for the drawing of advanced optical fibers, such as Bragg, microstructure or photonic crystal fibers, are usually constituted from stacks with non-symmetric internal structure or composed of alternating layers with high refractive index contrasts. In this paper we present comparison of refractive index profile measurements of simple as well as complex structures with high refractive index differences simulating the Bragg structures. Commercial Photon Kinetics 2600 preform analyzer was used for the refractive index profile measurements. A set of concentrically arranged silica tubes was welded to form a complex preforms. Free space between the tubes was filled by immersion with varying refractive indices to simulate the Bragg structure. Up to three tubes were used for the analysis and the refractive indices of immersion were changed from 1.4 to 1.5. When refractive index of immersion was independently measured the structure of preform was defined. Profiles of these "known" structures were compared to measured data processed by originally proposed algorithm. The work provides an extension of issues of refractive index profile measurements in non-symmetric complex silica structures by a commercial preform analyzer and proposes more convenient methods of numeric data processing.
机译：折射率轮廓测量是用于表征预制件的光学性质的关键仪器，用于绘制高质量的光纤。普通工业光学预成型分析仪设计用于测量简单的对称结构，例如逐步指数或渐变索引预制件，其折射率接近二氧化硅（n = 1.457，在633nm处）。然而，这些条件通常远离光纤激光器或光纤传感器区域中使用的更复杂的结构。用于绘制先进光纤的预成型件，例如布拉格，微观结构或光子晶体纤维通常由具有非对称内部结构的堆叠构成或由具有高折射率对比的交替的层组成。在本文中，我们对模拟布拉格结构的高折射率差异的复杂结构的折射率曲线测量进行比较。商业光子动力学2600预制件分析仪用于折射率曲线测量。焊接一组同心排列的二氧化硅管以形成复杂的预制件。管之间的自由空间通过浸入不同的折射率来填充以模拟布拉格结构。最多三个管用于分析，浸渍折射率从1.4变为1.5。当浸渍折射率独立地测量预制量的结构时。将这些“已知”结构的简档与最初提出的算法进行了测量的数据进行了比较。该工作通过商业预制件分析器提供了非对称复杂二氧化硅结构中的折射率轮廓测量问题的延伸，并提出了更方便的数字数据处理方法。

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