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Improvements in the Scanning Long-wave Optical Test System

机译：扫描长波光学测试系统的改进

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The Scanning Long-wave Optical Test System (SLOTS) is a slope measuring deflectometry system that provides accurate measurements on ground surfaces. As it uses a thermal source, we can measure an optic during the grinding phase which allows us to correct figure errors when material removal is much faster. We have made improvements in SLOTS, such as the step-and-stare method, the ceramic rod, and the Gaussian fitting processing software, so that this system supports higher accuracy and resolution. As a result, SLOTS is an optical testing system that covers a huge portion of the fabrication process from the grinding to the figuring. It is a complementary solution for other metrology systems such as the laser tracker, SCOTS, and null interferometry. SLOTS can reduce the manufacturing time by producing ground aspheres that have low errors of the surface figure when polishing begins.
机译：扫描长波光学测试系统（SLOTS）是一种斜度测量偏折法系统，可在地面上提供准确的测量结果。由于它使用热源，因此我们可以在研磨阶段测量光学元件，这可以使我们在去除材料的速度更快时纠正图形误差。我们对SLOTS进行了改进，例如分步凝视法，陶瓷棒和高斯拟合处理软件，以便该系统支持更高的精度和分辨率。因此，SLOTS是一种光学测试系统，涵盖了从磨削到图形加工的大部分制造过程。它是其他计量系统（例如激光跟踪器，SCOTS和零干涉仪）的补充解决方案。 SLOTS可通过生产研磨开始时表面形状误差低的研磨非球面材料来减少制造时间。

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