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Characterization of an aspherical surface with null screens using exact ray tracing

机译：使用精确的光线追踪技术对具有非屏蔽屏幕的非球面进行表征

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One of the most used methods to measure the quality of optical surfaces by light transmission is the deflectometry. To implement this technique, an arbitrary ray selector is used to choose some incident rays. Measuring the intersection of the rays refracted by the surface, in a posterior detection plane perpendicular to the optical axis, the normal at the surface under test, it is determined. Whith measurement points, the shape of the surface is determined by their integration. The process is simple if the incident rays are chosen in a called null configuration, since it is expected that all refracted rays will strike a predetermined ordered array in the detection plane. To numerical calculation we using an ideal surface on this test. In order to full measuare of the surface on simulation, we used vector form of exact ray tracing. To carry out the necessary numerical simulations for a null screen, we considering a point light source and the selector placed in arbitrary position between the point source lens of the test. Some numerical simulations are shown and are compared with experimental results.
机译：偏光法是通过光透射来测量光学表面质量的最常用方法之一。为了实现该技术，使用任意光线选择器选择一些入射光线。在垂直于光轴的后检测平面中，测量被表面折射的光线的交点，确定被测表面的法线。在测量点上，表面的形状由它们的积分确定。如果以所谓的零配置选择入射光线，则该过程很简单，因为可以预期所有折射光线都将撞击检测平面中的预定有序阵列。为了进行数值计算，我们在此测试上使用了理想的表面。为了在仿真中全面测量表面，我们使用了精确射线追踪的矢量形式。为了对空屏进行必要的数值模拟，我们考虑了点光源和选择器放置在测试点光源之间的任意位置。显示了一些数值模拟，并将其与实验结果进行了比较。

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