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Obsolescence in EMC Risk Assessment: A Case Study on EFT Immunity of Microcontrollers

机译:EMC风险评估中的过时:以微控制器的EFT免疫为例

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This paper investigates the obsolescence in EMC risk assessment by conducting an experimental case study on two commercially available Atmel microcontrollers (μCs), i.e. SAM3 and SAM7, the former being more recent but still pin-to-pin compatible. To this end, electrical fast transient (EFT) testing was performed according to the IEC 61000-4-4 standard to identify and clarify the failure occurring in the μCs individual voltage supply pins. The μC crash was considered as the immunity criterion to monitor the failure due to the EFT bursts. Results demonstrate, in a reproducible manner, that SAM3 was more immune to transient disturbances compared to SAM7 on all the considered supply pins, excluding the phase-locked loop. Moreover, regardless of the μC version, the core supply pin was found to be the most susceptible to EFT injection. These results show that replacing a SAM7 μC by a SAM3 μC calls for a detailed EMC analysis, particularly when dealing with obsolescence, since a more modern, compatible IC does not necessarily provide a higher immunity.
机译:本文通过对两个市售的Atmel微控制器(μC),即SAM3和SAM7进行实验案例研究,研究了EMC风险评估的过时情况,前者是较新的但仍与引脚对引脚兼容。为此,根据IEC 61000-4-4标准执行了电气快速瞬变(EFT)测试,以识别并弄清在μC单个电源引脚中发生的故障。 μC崩溃被认为是监视由于EFT突发而导致的故障的抗扰度标准。结果以可重现的方式表明,在所有考虑的电源引脚上(与锁相环无关),与SAM7相比,SAM3对瞬态干扰的免疫力更强。此外,无论μC版本如何,都发现内核电源引脚最容易受到EFT注入的影响。这些结果表明,用SAM3μC代替SAM7μC需要进行详细的EMC分析,尤其是在淘汰时,因为更现代,更兼容的IC不一定提供更高的抗扰性。

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