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Critical faults of leakage errors on the surface code

机译：表面代码泄漏错误的严重故障

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摘要

Leakage is a particularly damaging error that occurs when a qubit leaves the defined computational subspace. Leakage errors limit the effectiveness of quantum error correcting codes by spreading additional errors to other qubits and corrupting syndrome measurements. The effects of leakage errors on the surface code has been studied in various contexts. However, the effects of a leaked data qubit versus a leaked ancilla qubit can be quite different. Here, we study the effects of data leakage and ancilla leakage separately. We find that data leakage is much less damaging. We show that the surface code maintains its distance in the presence of leakage by either confining leakage to data qubits or eliminating ancilla qubit leakage at the critical fault location. To demonstrate this, we introduce new techniques for handling leakage: taking advantage of gates with one-sided leakage, effectively isolating leakage events to data qubits alone and mixing two types of leakage reducing circuits, to handle data leakage and ancilla leakage separately.
机译：泄漏是当量子位离开定义的计算子空间时发生的特别有害的错误。泄漏错误通过将其他错误扩展到其他量子位并破坏校正子测量值，从而限制了量子错误校正代码的有效性。已经在各种情况下研究了泄漏误差对表面代码的影响。但是，泄漏的数据量子位与泄漏的辅助量子位的影响可能是完全不同的。在这里，我们分别研究数据泄漏和辅助泄漏的影响。我们发现数据泄漏的破坏性要小得多。我们表明，通过将泄漏限制在数据量子位或消除关键故障位置处的辅助量子位泄漏，表面代码可以在存在泄漏的情况下保持其距离。为了证明这一点，我们引入了处理泄漏的新技术：利用具有单侧泄漏的门的优势，将泄漏事件有效地隔离到单独的数据qubit中，并混合两种类型的泄漏减少电路，分别处理数据泄漏和辅助泄漏。

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