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How Could Device Security Against Unauthorized Internal Chip Access be Married with Design For Testability?

机译:如何将设备安全性与未经授权的内部芯片访问进行结婚,以进行可测试性?

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摘要

New devices with security-critical functions like in money- or credit cards frequently have protective top metal layers in order to avoid unauthorized internal chip-access for testing or modifying the device. However, design/process debug and FA need such access to accelerate learning for production ramp-up and design debugging. The paper shows a design approach how to allow authorized access for internal probing in such case.
机译:具有安全性关键功能的新设备通常具有保护顶部金属层,以避免未经授权的内部芯片访问进行测试或修改设备。但是,设计/过程调试和FA需要此类访问,以加速生产升级和设计调试的学习。本文显示了一种设计方法如何允许在这种情况下允许授权访问内部探测。

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