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Functional Safety for Integrated Circuits

机译:集成电路的功能安全性

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Integrated circuits are at the root of all modern safety systems. Integrated circuits supply the logic, either control the sensors or to a growing extent are the sensors. Integrated circuits(IC) drive the final elements to achieve a safe state. Integrated circuits are the platform on which the software runs. The level of integration possible within semiconductors can simplify the system level implementation at the cost of the added complexity within the IC itself. The level of integration gives improvements in system reliability due to parts count reduction, offers opportunities for increased diagnostic coverage with lower diagnostic test intervals and all at a cost that makes safety achievable. It could argued that this level of integration is a bad thing because of the added complexity. However at the price of complexity in the integrated circuits can come a major simplification at the module and system levels. Surprisingly while there are functional safety standards which address process control, machinery, elevators, variable speed drives and toxic gas sensor there is no functional safety standard dedicated to integrated circuits. This paper gives guidance on interpreting the existing functional safety standards for semiconductors.
机译:集成电路处于所有现代安全系统的根源。集成电路提供逻辑,无论是控制传感器还是在不断发展的程度上都是传感器。集成电路(IC)驱动最终元件以实现安全状态。集成电路是软件运行的平台。半导体中可能的集成水平可以简化系统级实现,以IC本身的添加复杂性的成本。整合水平由于零件计数而导致系统可靠性提高,为具有较低诊断测试间隔的诊断覆盖率增加了机会,并以实现安全可实现的成本。它可以认为,由于增加的复杂性,这一整合水平是坏事。然而,在集成电路中复杂性的价格可以在模块和系统级别中进行重大简化。令人惊讶的是,虽然存在寻址过程控制,机械,电梯,变速驱动和有毒气体传感器的功能安全标准,但没有专用于集成电路的功能安全标准。本文为解释了解释了半导体的现有功能安全标准的指导。

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