Static Component Interconnection Test Technology (SCITT) is a new XNOR circuit based technology that is used for board-level interconnection test.SCITT provides an easy test method using simple patterns and results in a high diagnostic resolution. The method is especially suited for SDRAM and other 'complex memories' but can be used for other devices as well. Very little overhead is required. Areal silicon implementation is presented and evaluated.
展开▼