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A theory for the image production mechanism of scanning nonlinear dielectric microscopy and its application to the quantitative evaluation of linear and nonlinear dielectric properties of ferroelectric and piezoelectric materials

机译:扫描非线性介电显微镜图像生产机理的理论及其应用于铁电和压电材料线性和非线性介电性能的定量评价

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A theory for scanning nonlinear dielectric microscopy (SNDM) and its application to the quantitative evaluation of the linear and nonlinear dielectric constants of dielectric materials are described. First, a general theorem for the capacitance variation under an applied electric field is derived and a capacitance variation susceptibility S{sub}(nl), which is a very useful parameter for the quantitative measurement of nonlinear dielectric constants, is defined. This S{sub}(nl) is independent of the tip radius, and therefore the sensitivity of the SNDM probe does not change, even if a tip with a smaller radius is selected to obtain a finer resolution. Using the theoretical results and the data taken by SNDM, the quantitative linear and nonlinear dielectric properties of several dielectric materials were successfully determined. From the calculation of a one-dimensional image of a 180° c-c domain boundary, it is demonstrated that the SNDM has an atomic scale resolution.
机译:描述了扫描非线性介电显微镜(SNDM)的理论及其在介电材料的线性和非线性介电常数的定量评价中。首先,推导出应用电场下电容变化的通用定理,并且限定了电容变化敏感性S {Sub}(NL),其是用于非线性介质常数的定量测量的非常有用的参数。该S {Sub}(NL)与尖端半径无关,因此即使选择具有较小半径的尖端以获得更精细的分辨率,SNDM探针的灵敏度也不会改变。使用理论结果和SNDM所采取的数据,成功确定了几种介电材料的定量线性和非线性电介质特性。根据180°C-C域边界的一维图像的计算,证明SNDM具有原子尺度分辨率。

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