To evaluate radiated immunity/susceptibility characteristics for the chassis of an electronics-product with complex configuration, authors have already proposed a new test method using an electromagnetic field whose polarization rotates slowly. By using this method, three-dimensional characteristics was depicted such that weak/strong directions against various field polarizations could be obtained easily. In this paper, as an application of this method, a tower-type personal computer chassis is considered and its three dimensional characteristics is obtained. It should be mentioned that it is very difficult to theoretically evaluate and/or estimate the above characteristics. Therefore, the proposed test method would be expected in a phase of developing products.
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