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A Simplified Extension of X-parameters to Describe Memory Effects for Wideband Modulated Signals

机译:X参数的简化扩展,以描述宽带调制信号的存储器效果

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An original way is presented to model memory effects of microwave amplifiers in the case of wideband modulated signals. The model is derived as a limiting case of the more general dynamic X-parameter theory. For a given component, the model is identified from pulsed envelope X-parameter measurements performed with an NVNA. The resulting nonlinear X-parameter model is quantitatively described by a 2-variate kernel function that enables the derivation of an optimal static AM-AM AM-PM characteristic for every possible input envelope probability density function. The model is validated by performing a set of 2-tone experiments. The model can be implemented in the ADS circuit envelope simulator.
机译:在宽带调制信号的情况下,提出了一种原创的方式以模拟微波放大器的存储器效果。该模型被推出为更通用的动态X参数理论的限制情况。对于给定的组件,该模型从用NVNA进行的脉冲包络X参数测量识别。通过2变形内核功能定量地描述了所得到的非线性X参数模型,其能够为每个可能的输入包络概率密度函数推导出最佳静态AM-AM-PM特性。通过执行一组2色实验来验证该模型。该模型可以在ADS电路包络模拟器中实现。

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