首页> 外文会议>Conference on laser diodes and applications >Measurement and parameter extraction of semiconductor lasers: experiences of the pan-European action COST 240
【24h】

Measurement and parameter extraction of semiconductor lasers: experiences of the pan-European action COST 240

机译:半导体激光器的测量和参数提取:泛欧行动成本240的经验

获取原文

摘要

COST 240 is a pan-European action collaborating on the investigation of techniques for modeling and measuring photonic components. This action has concentrated on inter- laboratory comparison of measurement and modeling techniques using round-robin measurement of sample devices. The present paper reviews the work performed within this action on measurement of and parameter extraction from single frequency semiconductor laser diodes. Specifically, those measurements that have been made in order to estimate laser parameters include; Relative Intensity Noise, modulation response, emission linewidth, several static characteristics and amplified spontaneous emission below threshold. Some of the parameters that can be estimated from these measurements include; threshold current, external efficiency, diode resistance, internal loss, characteristic temperature, differential gain, gain compression parameter, facet reflectivities, facet phases, index and gain coupling coefficients, and group refractive index. Following a review of the typical measurements performed on circulated lasers within the COST 240 Action by participating laboratories, a brief description will be presented of the physical models adopted to extract the laser diode parameters. Examples will be presented and conclusions given as to the suitability of certain techniques for the extraction of diode parameters for single frequency lasers.
机译:240成本是一项泛欧行动,协作对建模和测量光子成分的技术的研究。使用循环测量样品装置的测量和建模技术的实验室比较集中了。本文综述了在单频半导体激光二极管的测量和参数提取的作用中执行的工作。具体而言,为了估计激光参数而进行的那些测量包括;相对强度噪声,调制响应,发射线宽,几个静态特征和放大的自发发射低于阈值。可以从这些测量中估计的一些参数包括;阈值电流,外部效率,二极管电阻,内部损耗,特征温度,差分增益,增益压缩参数,小平面反射率,小相,指数和增益耦合系数,以及组折射率。在通过参与实验室在成本240行动中对循环激光器进行的典型测量进行审查,将介绍采用的物理模型来提取激光二极管参数的简要描述。将提出和结论,得出关于单频激光器提取二极管参数的某些技术的适用性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号