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Full-field optical measurement for material parameter identification with inverse methods

机译:具有逆方法的材料参数识别的全场光学测量

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The application of FE simulation in manufacturing processes and virtual prototyping increases every day. In order to allow accurate simulations, correct constitutive models are needed as input to the FE software. A modern and promising way to identify the material parameters in those constitutive models is "inverse modeling". Full-field measurement is a suitable way to get the necessary experimental data. The technique has many advantages such as large information contents, non-contacting measurement, and versatile size of observation region, among others. However, there is no standardization yet for this kind of measurements. Therefore, there are many disagreements among researchers about how to design DICT experiments and how to correctly collect the data from DICT experiments. This paper will concentrate on discussing the key points of those problems as well as presenting some work experience with the DICT.
机译:FE模拟在制造过程中的应用和虚拟原型每天增加。为了允许准确的仿真,需要正确的本体模型作为FE软件的输入。识别这些本构模型中的材料参数的现代和有希望的方法是“逆建模”。全场测量是获得必要的实验数据的合适方式。该技术具有许多优点,例如大型信息内容,非接触测量和观察区域的多功能大小等。但是,对于这种测量,没有标准化。因此,研究人员在如何设计DICT实验以及如何从DICT实验中正确收集数据的研究人员之间存在许多分歧。本文将集中精力讨论这些问题的关键点,以及提出一些工作经验。

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