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Effect of Microwave Radiation on the Stability of Terahertz Hot-Electron Bolometer Mixers

机译:微波辐射对太赫兹热电计钻头混合器稳定性的影响

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We report our studies of the effect of microwave radiation, with a frequency much lower than that corresponding to the energy gap of the superconductor, on the performance of the NbN hot-electron bolometer (HEB) mixer incoiporated into a THz heterodyne receiver. It is shown that exposing the HEB mixer to microwave radiation does not result in a significant rise of the receiver noise temperature and degradation of the mixer conversion gain so long as the level of microwave power is small compared to the local oscillator drive. Hence the injection of a small, but controlled amount of microwave radiation enables active compensation of local oscillator power and coupling fluctuations which can significantly degrade the stability of HEB mixer receivers.
机译:我们报告了我们对微波辐射的影响的研究,频率远低于对应于超导体的能隙的频率,在NBN热电子钻头(HEB)混合器中排入到THz外差接收器中的性能。结果表明,将HEB混合器暴露于微波辐射不会导致接收器噪声温度的显着升高,并且混频器转换增益的劣化,只要与本地振荡器驱动器相比,微波功率的水平较小。因此,注入小但受控量的微波辐射能够激活局部振荡器功率和耦合波动,这可以显着降低HEB混合器接收器的稳定性。

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