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Probing the surface chemistry of single nanowire sensor in operando mode

机译:探讨单纳米线传感器在Outmando模式下的表面化学

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The individual single crystalline and polycrystalline single SnO_2 nanowire sensors have been fabricated on the base of the NIST micro-hot plates. Using Scanning Photoelectron Microscope (SPEM) with the lateral resolution of ca 80 nm we were able to access spectroscopicaly (XPS) the changes of surface chemistry of the individual nanowires during their operation. It was possible in real time to monitor the changes in conductance of the nanowire upon redox gas exposure and link them to the formation of the specific surface groups. The effect of crystallinity of the nanowires and electroactive defects on their sensing performance has been studied.
机译:在NIST微热板的基部上制造了个体单晶和多晶单个SnO_2纳米线传感器。 使用扫描光电子显微镜(SPEM)具有Ca 80nm的横向分辨率,我们能够在其操作期间进入各个纳米线的表面化学变化的光谱(XPS)。 实时可以实时监测纳米线的电导变化,并将其连接到形成比表面基团。 研究了纳米线的结晶度和电活性缺陷对其传感性能的影响。

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