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首页> 外文会议>International Seminar on Electron Devices Design and Production >Calculation of The Absorbed Dose of Electron Radiation in Polymer Cases of Microelectronic Devices, Considering the Factor of Its Accumulation
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Calculation of The Absorbed Dose of Electron Radiation in Polymer Cases of Microelectronic Devices, Considering the Factor of Its Accumulation

机译：微电子器件聚合物壳体电子辐射吸收剂量的计算，考虑到其累积因子

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A computer simulation of the depth course of the absorbed dose as a function of the electronic irradiation energy of the acting in the range of 30 - 60 keV was performed, and calculations of the dose accumulation factor under these conditions were performed for polyethylene terephthalate, polymethylmethacrylate, polystyrene and low-density polyethylene, as model polymers of microelectronic device housings. It is shown that the electron energy values corresponding to the maximum dose accumulation factor depend on the polymer density.The conducted studies allow us to determine with great accuracy the conductivity of plastic cases of microelectronic devices under conditions of electronic irradiation, which is of particular interest to exclude the physical possibility of the occurrence of electrostatic discharges that lead to failures of the onboard electronics of spacecraft.
机译：在30-60keV的范围内的作用的电子照射能量的函数的吸收剂量的深度过程的计算机模拟，并对这些条件下的剂量积聚因子的计算用于聚对苯二甲酸乙二醇酯，聚甲基丙烯酸乙二醇酯 ，聚苯乙烯和低密度聚乙烯，作为微电子器件壳体的模型聚合物。 结果表明，对应于最大剂量累积因子的电子能量值取决于聚合物密度。进行的研究允许我们在电子照射条件下极大地确定微电子器件的塑料情况的电导率，这是特别的兴趣 为了排除发生静电放电的物理可能性，从而导致航天器的板载电子器件的故障。

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