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Characterization and Analysis of Single Electron Fault of QCA Primitives

机译：QCA基元单电子故障的表征与分析

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Quantum-dot Cellular Automata (QCA) has emerged as a viable alternative for the traditional VLSI providing high device density and computing speed at nanoscale dimensions. Despite its advantages, QCA is quite susceptible to high error rate. Also, recent cell development technology has led to significant changes in the manufacturing techniques of QCA giving rise of new types of permanent defects. One such permanent faults, single electron fault (SEF) are likely to occur inside the cell. We have analysed these defects by using majority voter because of their driver/logic cell responsible for signal transition and propagation. The effect of the SEF are verified with the help of physical proof. The results show that majority voter transmits completely undesirable output in presence of SEF.
机译：量子点蜂窝自动机（QCA）已成为传统VLSI提供高器件密度和纳米级尺寸的计算速度的可行替代品。尽管有其优势，QCA非常容易受到差错率的影响。此外，最近的细胞开发技术导致了QCA制造技术的显着变化，从而产生了新型永久性缺陷。一个这样的永久性故障，在细胞内部可能发生单电子故障（SEF）。由于其驾驶员/逻辑单元负责信号转换和传播，我们通过使用多数选民分析了这些缺陷。通过身体证明验证了SEF的效果。结果表明，大多数选民在SEF存在下透射完全不希望的输出。

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