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TiO_2 ANTI-RESONANT LAYER ARROW WAVEGUIDES

机译:TiO_2反共振层箭头

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The simulation, fabrication and characterization of ARROW waveguides using dielectric films deposited by Plasma Enhanced Chemical Vapor Deposition (PECVD) and Sputtering techniques, are presented in this work. Amorphous titanium oxide (TiO_2) films were used as first cladding layer and silicon oxynitride (SiO_xN_y) films, as core and second cladding layers. Furthermore, homemade routines based in two computational methods were developed, for numerical simulations: Transfer Matrix Method (TMM) for the determination of the optimum thickness values of the Fabry-Perot layers, and the Finite Difference Method (FDM) for 2D design and determination of the maximum width that allows single-mode operation. The utilization of titanium oxide as first anti-resonant layer resulted in low optical attenuations, since high interlayer refractive index differences can be obtained.
机译:本工作介绍了使用等离子增强化学气相沉积(PECVD)和溅射技术沉积的介电膜对ARROW波导进行的仿真,制造和表征。非晶态氧化钛(TiO_2)薄膜用作第一覆层,氮氧化硅(SiO_xN_y)薄膜用作芯层和第二覆层。此外,还开发了基于两种计算方法的自制例程,用于数值模拟:用于确定Fabry-Perot层最佳厚度值的传递矩阵法(TMM),以及用于2D设计和确定的有限差分法(FDM)。允许单模操作的最大宽度的最大值。利用氧化钛作为第一抗谐振层导致低的光学衰减,因为可以获得高的层间折射率差。

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