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Piezoresistive Pens for Dip-Pen Nanolithography

机译:浸笔纳米光刻的压阻笔

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The conventional approach to measurement of the deflection of microfabricated cantilevers centers on the use of an optical lever. The use of optical lever technology increases the size, complexity, and cost of systems using microfabricated cantilevers. Occasionally, piezoresistors have been used to sense deflection. But, for atomic force microscope applications in particular, topographical sensitivity has demanded the higher sensitivity of the optical lever. For dip-pen nanolithography (DPN) microfabricated cantilevers do not require the same degree of deflection sensitivity. So, for these applications, piezoresistors can be used to sense deflection. In this work, we present a novel approach to an integrated DPN pen. Piezoresistive silicon stress sensors are integrated into a silicon nitride cantilever. The device design, process design, and fabrication methods for building these sensors, and sensor-actuators, are demonstrated. Integration of heaters, along with the piezoresistors, is also demonstrated.
机译:测量微型悬臂梁挠度的常规方法集中在光学杠杆的使用上。光学杠杆技术的使用增加了使用微细悬臂的系统的尺寸,复杂性和成本。有时,压阻器已被用来检测挠度。但是,特别是对于原子力显微镜应用,地形敏感性要求光学杠杆具有更高的敏感性。对于浸笔式纳米光刻(DPN),微细悬臂不需要相同程度的偏转灵敏度。因此,对于这些应用,可以使用压敏电阻来检测偏转。在这项工作中,我们提出了一种集成DPN笔的新颖方法。压阻式硅应力传感器集成在氮化硅悬臂中。演示了用于构建这些传感器和传感器执行器的设备设计,过程设计和制造方法。还展示了加热器与压敏电阻的集成。

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