Charge Contrast Imaging of Gibbsite in the Variable Pressure SEM

著录项

• 来源
  《Microscopy Society of America annual meeting;Microscopy Society of Canada annual meeting;Societe de Microscopie du Canada annual meeting;Microbeam Analysis Society annual meeting;International Metallographic Society annual meeting》|2002年|1-2|共2页
• 会议地点 Quebec City(CA);Quebec City(CA);Quebec City(CA);Quebec City(CA);Quebec City(CA)
• 作者

  K. Robertson; R. Gauvin; J. Finch;

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• 作者单位

  McGill University, Mining, Metals and Materials Engineering, M.H. Wong building,rn3610 University Street, Montreal, Quebec, H3A 2B2;

  McGill University, Mining, Metals and Materials Engineering, M.H. Wong building,rn3610 University Street, Montreal, Quebec, H3A 2B2;

  McGill University, Mining, Metals and Materials Engineering, M.H. Wong building,rn3610 University Street, Montreal, Quebec, H3A 2B2;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类 观察、分析晶体结构的实验方法;
• 关键词