Ultrastructral Analysis of Synapse in a Drosophila of the Swedish Mutation Which Causes Early-Onset Alzheimer's Disease Using Focused Ion Beam Microscopy

著录项

• 来源
  《International Metallographic Society Annual meeting;Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting》|2011年|216-217|共2页
• 会议地点 Nashville TN(US)
• 作者

  Se Jin Park; Andreas Schertel; Sung Sik Han;

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• 作者单位

  Laboratory of cell engineering and 3D structure, School of Life Sciences and Biotechnology, KorearnUniversity, Seoul, Korea;

  Carl Zeiss NTS GmbH, Oberkochen, Germany;

  rnLaboratory of cell engineering and 3D structure, School of Life Sciences and Biotechnology, KorearnUniversity, Seoul, Korea sshan@korea.ac.kr;

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• 会议组织
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词