High Count Rate Standardless and Standard-Based Quantification in EDS – Practical Limits and Root Causes for Deviations in the Result

机译：EDS中的高计数率无标准和基于标准的定量分析–实际极限和结果偏差的根本原因

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《Microscopy and microanalysis.;Microscopy and microanalysis.》|2010年|p.1314-1315|共2页
会议地点 Portland OR(US)
作者
S. Scheller; T. Salge; R. Terborg;
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作者单位

Bruker AXS Microanalysis GmbH, Schwarzschildstr. 12, 12489 Berlin, Germany;

Bruker AXS Microanalysis GmbH, Schwarzschildstr. 12, 12489 Berlin, Germany;

Bruker AXS Microanalysis GmbH, Schwarzschildstr. 12, 12489 Berlin, Germany;

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正文语种 eng
中图分类显微镜;
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High Count Rate Standardless and Standard-Based Quantification in EDS – Practical Limits and Root Causes for Deviations in the Result

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