“H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEMPreparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation

著录项

• 来源
  《Microscopy Society of America annual meeting;Microscopy Society of Canada annual meeting;Societe de Microscopie du Canada annual meeting;Microbeam Analysis Society annual meeting;International Metallographic Society annual meeting》|2002年|1-2|共2页
• 会议地点 Quebec City(CA);Quebec City(CA);Quebec City(CA);Quebec City(CA);Quebec City(CA)
• 作者

  R. J. Patterson; D. Mayer; L. Weaver; M.W. Phaneuf;

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• 作者单位

  Fibics Incorporated 556 Booth St. Ottawa Ontario Canada K1A 0G1;

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• 会议组织
• 原文格式 PDF
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• 中图分类
• 关键词