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Aluminum Nitride Chip Carrier for Micro-electro-mechanical Sensor Applications

机译:氮化铝芯片载体,用于微机电传感器应用

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摘要

A commercially fabricated aluminum nitride chip carrier was evaluated for packaging various types of MEMS inertial sensors. They were successfully assembled and vacuum-sealed within A1N chip carriers and their pressures have remained stable for over one year. Aging tests were conducted under electrical bias at 85℃ and 85 %RH. The leakage currents were not as stable as those measured in alumina chip carriers and post test inspection of the A1N parts revealed etching of the ceramic between conductors.
机译:对商用氮化铝芯片载体进行了评估,以包装各种类型的MEMS惯性传感器。它们已成功地在A1N芯片载体中组装并真空密封,其压力已稳定超过一年。在85℃和85%RH的电偏压下进行老化测试。漏电流不如在氧化铝芯片载体中测得的电流稳定,对A1N部件的测试后检查显示,导体之间的陶瓷被腐蚀。

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