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Electrical properties of single-walled carbon nanotube films

机译:单壁碳纳米管薄膜的电性能

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摘要

We first demonstrate efficient patterning of conductive and transparent single-walled carbon nanotube films by photo- and e-beam lithography and subsequent reactive ion etching in an ICP-RIE system. We then study the geometry dependent transport characteristics of the film patterned into four point probe structures. We find that resistivity is independent of film length, while increasing significantly when width and thickness of the film shrink. We explain this behavior by a geometrical argument. The ability to pattern the film could enable the integration of nanotube films into electronic devices; however, the strong resistivity scaling should be carefully taken into account when designing submicron devices.
机译:我们首先展示了通过光电子束和电子束光刻以及随后在ICP-RIE系统中进行反应性离子蚀刻来对导电和透明单壁碳纳米管薄膜进行有效构图的方法。然后,我们研究了构图成四点探针结构的薄膜的几何形状相关的传输特性。我们发现电阻率与膜的长度无关,而当膜的宽度和厚度缩小时,电阻率会显着增加。我们通过几何论证来解释这种行为。对膜进行图案化的能力可以使纳米管膜集成到电子设备中。但是,在设计亚微米器件时,应仔细考虑强电阻率缩放。

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