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DETERMINATION OF TRAP PARAMETERS FROM PHOTOCURRENT DECAY MEASUREMENTS: METAL-FREE PHTHALOCYANINE FILMS

机译:用光电流衰减法测定捕集参数:无金属酞菁薄膜

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摘要

The energy distribution of traps in gap samples of thin vacuum-evaporated metal-free phthalocyanine (H_2Pc) films was determined from measurements of photocurrent decays performed at several temperatures, in a nitrogen atmosphere. The parameters of the traps were determined using a straightforward method of the analysis of a first-order process, with distributed parameters. It was found that the photocurrents are controlled by a narrow distribution of shallow traps peaking at about 0.2 eV, with a distribution width of about 0.015 eV and a very low effective attempt-to-escape factor.
机译:真空蒸发的无金属酞菁(H_2Pc)薄膜的间隙样品中陷阱的能量分布是根据在氮气氛中在几个温度下进行的光电流衰减测量确定的。陷阱的参数是使用具有分布参数的直接一阶过程分析方法确定的。已经发现,光电流受峰值为约0.2eV的浅陷阱的窄分布,约0.015eV的分布宽度和非常低的有效尝试逃逸因子的控制。

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