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Catastrophic optical mirror damage in diode lasers monitored during single pulse operation

机译:单脉冲操作期间监测的二极管激光器的灾难性光学镜损坏

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The catastrophic optical mirror damage (COMD) effect is analyzed for 808 nm emitting diode lasers in single-pulse operation. During each single pulse, both nearfield of the laser emission and thermal image of the laser facet are monitored with cameras being sensitive in the respective spectral regions. A temporal resolution in the μs-range is achieved. The COMD is unambiguously related to the occurrence of a 'thermal flash' detected by thermal imaging. A one-by-one correlation between emission nearfield, 'thermal flash', thermal runaway, and structural damage is observed. As a consequence of the single-pulse-excitation technique, the propagation of 'dark bands' as observed in photo- or cathodoluminescence maps in the plane of the active region from the front facet is halted after the first pulse. Because of the rapidness of the thermal runaway, we propose the single-pulse technique for testing the facet stability and the intentional preparation of early stages of COMD; even for diode lasers that regularly fail by other mechanisms.
机译:分析了单脉冲操作中808 nm发射二极管激光器的灾难性光学镜损坏(COMD)效应。在每个单个脉冲期间,使用在各个光谱区域中敏感的摄像机来监视激光发射的近场和激光刻面的热图像。达到了μs范围内的时间分辨率。 COMD无疑与通过热成像检测到的“热闪光”的发生有关。观察到了发射近场,“热闪光”,热失控和结构破坏之间的一对一相关性。作为单脉冲激励技术的结果,在第一个脉冲之后,停止了从前端面在有源区域平面中在光或阴极发光图中观察到的“暗带”的传播。由于热失控的迅速性,我们提出了单脉冲技术来测试刻面稳定性并有意准备COMD的早期阶段。即使对于经常因其他机制而失效的二极管激光器也是如此。

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