Study of Structural Defects in CdZnTe Crystals by High Resolution Electron Microscopy

机译：高分辨率电子显微镜研究CdZnTe晶体的结构缺陷

获取原文

获取原文并翻译 | 示例

页面导航

摘要
著录项
相似文献
相关主题

摘要

We investigated defects in CdZnTe crystals produced from various conditions and their impact on fabricated devices. In this study, we employed transmission and scanning transmission electron microscope (TEM and STEM), because defects at the nano-scale are not observed readily under an optical or infrared microscope, or by most other techniques. Our approach revealed several types of defects in the crystals, such as low-angle boundaries, dislocations and precipitates, which likely are major causes in degrading the electrical properties of CdZnTe devices, and eventually limiting their performance.

机译：我们研究了各种条件下产生的CdZnTe晶体中的缺陷及其对制造器件的影响。在这项研究中，我们采用了透射和扫描透射电子显微镜（TEM和STEM），因为在光学或红外显微镜或大多数其他技术下不容易观察到纳米级的缺陷。我们的方法揭示了晶体中几种类型的缺陷，例如低角度边界，位错和沉淀，这可能是导致CdZnTe器件电性能下降并最终限制其性能的主要原因。

著录项

来源
《Nuclear radiation detection materials-2011》|2011年|p.67-71|共5页
会议地点 San Francisco CA(US);San Francisco CA(US)
作者
V Hossain; A. E. Bolotnikov; G. S. Camarda; Y. Cui; R. Gul; K-H. Kim; K. Kisslinger; D. Su; G. Yang; L. H. Zhang; R. B. James;
展开▼
作者单位

Brookhaven National Laboratory, Upton, NY 11973, USA;

Brookhaven National Laboratory, Upton, NY 11973, USA;

Brookhaven National Laboratory, Upton, NY 11973, USA;

Brookhaven National Laboratory, Upton, NY 11973, USA;

Brookhaven National Laboratory, Upton, NY 11973, USA;

Brookhaven National Laboratory, Upton, NY 11973, USA;

Brookhaven National Laboratory, Upton, NY 11973, USA;

Brookhaven National Laboratory, Upton, NY 11973, USA;

Brookhaven National Laboratory, Upton, NY 11973, USA;

Brookhaven National Laboratory, Upton, NY 11973, USA;

Brookhaven National Laboratory, Upton, NY 11973, USA;

展开▼
会议组织
原文格式 PDF
正文语种 eng
中图分类功能材料;
关键词

相似文献

外文文献
中文文献
专利

1. Transmission electron microscopy and high-resolution electron microscopy studies of structural defects induced in Si single crystals implanted by helium ions at 600 ℃ [J] . Han W. T., Liu H. P., Li B. S. Applied Surface Science . 2018,第OCTa15期

机译：透射电子显微镜和高分辨率电子显微镜研究在600℃下氦离子注入的Si单晶中引起的结构缺陷
2. Observations on Nanoscale Te Precipitates in CdZnTe Crystals Grown by the Traveling Heater Method Using High Resolution Transmission Electron Microscopy [J] . Boru Zhou, Wanqi Jie, Tao Wang, Crystals . 2018,第1期

机译：通过高分辨率透射电子显微镜通过行进加热器方法生长的Cdznte晶体中纳米级Te的观察
3. High-Resolution Electron Microscopy Analysis of Structural Defects in a (2/1, 5/3)-Type Approximant of a Decagonal Quasicrystal of an Al-Pd-Mn Alloy [J] . D.P. YU, G. REN, Z. ZHANG Metallurgical and materials transactions. A, physical metallurgy and materials science . 1996,第10期

机译：Al-Pd-Mn合金的十方准晶体的（2/1，5/3）型近似结构缺陷的高分辨率电子显微镜分析
4. Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study [C] . N Alem, Q.M. Ramasse, O.V. Yazyev, Microscopy Society of America Annual Meeting;Microanalysis Society Annual meeting;International Metallographic Society Annual meeting . 2012

机译：二维晶体中的缺陷：超高分辨率像差校正电子显微镜研究
5. Studies of defect generation in CdZnTe and InP single crystals using synchrotron white beam x-ray topography. [D] . Chung, Hua. 1997

机译：使用同步加速器白束X射线形貌研究CdZnTe和InP单晶中的缺陷生成。
6. Nanouric acid or nanocalcium phosphate as central nidus to induce calcium oxalate stone formation: a high-resolution transmission electron microscopy study on urinary nanocrystallites [O] . Jie Gao, Jun-Fa Xue, Meng Xu, 2014

机译：纳米尿酸或纳米磷酸钙为中心病菌诱导草酸钙结石形成：尿液纳米微晶的高分辨率透射电镜研究
7. Observations on Nanoscale Te Precipitates in CdZnTe Crystals Grown by the Traveling Heater Method Using High Resolution Transmission Electron Microscopy [O] . Boru Zhou, Wanqi Jie, Tao Wang, 2018

机译：用高分辨率透射电子显微镜观察行走式加热器生长的CdZnTe晶体中纳米级Te析出物

Study of Structural Defects in CdZnTe Crystals by High Resolution Electron Microscopy

摘要

著录项

相似文献

相关主题

期刊订阅