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Demonstration of depth-resolved wavefront sensing using a swept-source coherence-gated Shack-Hartmann wavefront sensor

机译:使用扫频源相干门控Shack-Hartmann波前传感器演示深度分辨波前传感

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In this report we demonstrate results of measuring wavefront aberrations from different depths in a fabricated phantom using a coherence-gated Shack-Hartman wavefront sensing technique (CG-SH/WFS). The SH/WFS is equipped with a Mach-Zehnder interferometer and the coherence gate operates on principles of swept source (SS) interferometry. The CG-SH/WFS is able to differentiate wavefront signals from different depths separated by a depth resolution of 7.1 micron. The CG-SH/WFS delivers a similar SH spot pattern as that provided by a conventional SH/WFS. Due to the coherence gate, the sensor is capable of eliminating stray reflections. Hereby we present the results of measuring depth-resolved wavefront aberrations. The method is robust and all depth-resolved aberrations are recorded simultaneously without any mechanical movement. This technique has the potential of providing depth resolved correction in adaptive optics assisted ophthalmology imaging and in nonlinear microscopy.
机译:在本报告中,我们演示了使用相干门控Shack-Hartman波前传感技术(CG-SH / WFS)在制作的体模中从不同深度测量波前像差的结果。 SH / WFS配备了Mach-Zehnder干涉仪,并且相干门工作在扫频(SS)干涉仪的原理上。 CG-SH / WFS能够区分不同深度的波前信号,其深度分辨率为7.1微米。 CG-SH / WFS提供与常规SH / WFS提供的相似的SH点图案。由于具有相干门,该传感器能够消除杂散反射。因此,我们提出了测量深度分辨波前像差的结果。该方法功能强大,并且无需任何机械移动即可同时记录所有深度分辨像差。该技术具有在自适应光学辅助眼科成像和非线性显微镜中提供深度分辨校正的潜力。

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