Simple refractometers for index measurements by minimum-deviation method from far ultraviolet to near infrared

机译：简单的折光仪，用于通过最小偏差法测量从远紫外到近红外的折射率

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Abstract: The focal shift of an optical filter used in non-collimated light depends directly on substrate thickness and index of refraction. The HST Advanced Camera for Surveys (ACS) requires a set of filters whose focal shifts are tightly matched. Knowing the index of refraction for substrate glasses allows precise substrate thicknesses to be specified. Two refractometers have been developed at the Goddard Space Flight Center (GSFC) to determine the indices of refraction of materials from which ACS filters are made. Modern imaging detectors for the near infrared, visible, and far ultraviolet spectral regions make these simple yet sophisticated refractometers possible. A new technology, high accuracy, angular encoder also developed at GSFC makes high precision index measurement possible in the vacuum ultraviolet by prism methods. !9

机译：摘要：用于非准直光的滤光片的焦点偏移直接取决于基材的厚度和折射率。 HST高级测量照相机（ACS）需要一组滤镜，其焦点偏移紧密匹配。知道衬底玻璃的折射率可以指定精确的衬底厚度。戈达德太空飞行中心（GSFC）已开发出两种折光仪，以确定制造ACS过滤器的材料的折射率。用于近红外，可见光和远紫外光谱区域的现代成像检测器使这些简单而复杂的折光仪成为可能。 GSFC还开发了一种新的技术，高精度，角度编码器，可通过棱镜方法在真空紫外线中进行高精度的指数测量。！9

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《Optical Diagnostic Methods for Inorganic Transmissive Materials》|1998年|p.148-159|共12页
会议地点 San Diego CA(US)
作者
Douglas B. Leviton; NASA Goddard Space Flight Ctr.; Greenbelt; MD; USA; Timothy J. Madison; NASA Goddard Space Flight Ctr.; Greenbelt; MD; USA; Peter Petrone; III; NSI Technical Services; Greenbelt; MD; USA.;
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中图分类无线电电子学、电信技术;
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Simple refractometers for index measurements by minimum-deviation method from far ultraviolet to near infrared

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