Abstract: The nondestructive measurement of refractive index of transmissive materials using null polarimetry is simple, accurate and does not require much on sample preparation. In null polarimetry, the ellipsometric parameter $psi for reflection from a sample is measured. $psi for transparent material is defined by tan $psi equals r$-p$//r$-s$/ where r$- p$/ and r$-s$/ are coefficients of reflection for the p- and s-polarization respectively. By choosing the angle of incidence $Theta near the Brewster angle, refractive index can be computed from $Theta and $psi directly. The only requirement on the sample is that no back surface reflection is allowed to mess up the front surface reflection. Precision in the refractive index is about 0.0004. Spectra of refractive index for quartz are measured and compared with the spectra quoted from existing Handbooks. !8
展开▼
