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Characterization of far-infrared optical thin film materials and blends: AgBr AgCl KBr Csl and CsBr

机译:远红外光学薄膜材料及其混合物的表征:AgBr AgCl KBr Csl和CsBr

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Abstract: The selection of thin film materials for use in far infrared filters is limited. While silicon can be used as a high index material in the far infrared, the suitability of low index materials is less understood. In this study, thin film materials with spectral transmission extending from 1 to beyond 30 micrometer are characterized and evaluated for use in Rugate and discrete interference filters. A materials selection matrix was developed, and five materials were selected for characterization. Transmission, reflection and absorption data are presented for AgBr, AgCl, KBr, CsI and CsBr as single material films, and as blends. These materials are characterized for stress, exposure to humidity, and color center formation when exposed to visible light. !4
机译:摘要:用于远红外滤光片的薄膜材料的选择受到限制。尽管硅可以用作远红外中的高折射率材料,但人们对低折射率材料的适用性却知之甚少。在这项研究中,对光谱透射范围从1到超过30微米的薄膜材料进行了表征和评估,以用于Rugate和离散干涉滤光片。开发了材料选择矩阵,并选择了五种材料进行表征。给出了AgBr,AgCl,KBr,CsI和CsBr的透射,反射和吸收数据,这些数据为单一材料薄膜和共混物。这些材料具有应力,暴露于湿气以及暴露于可见光时色心形成的特征。 !4

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